Wide-bandwidth charge sensitivity with a radio-frequency field-effect transistor

نویسندگان

  • Katsuhiko Nishiguchi
  • Hiroshi Yamaguchi
  • Akira Fujiwara
  • Herre S. J. van der Zant
  • Gary A. Steele
چکیده

We demonstrate high-speed charge detection at room temperature with single-electron resolution by using a radio-frequency field-effect transistor (RF-FET). The RF-FET combines a nanometerscale silicon FET with an impedance-matching circuit composed of an inductor and capacitor. Driving the RF-FET with a carrier signal at its resonance frequency, small signals at the transistor’s gate modulate the impedance of the resonant circuit, which is monitored at high speed using the reflected signal. The RF-FET driven by high-power carrier signals enables a charge sensitivity of 2 10 4 e/Hz at a readout bandwidth of 20 MHz. VC 2013 AIP Publishing LLC. [http://dx.doi.org/10.1063/1.4822430]

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تاریخ انتشار 2013